patch-2.4.4 linux/include/asm-sparc64/estate.h

• Lines: 51
• Date: Thu Apr 12 12:10:25 2001
• Orig file: v2.4.3/linux/include/asm-sparc64/estate.h
• Orig date: Wed Dec 31 16:00:00 1969

diff -u --recursive --new-file v2.4.3/linux/include/asm-sparc64/estate.h linux/include/asm-sparc64/estate.h
@@ -0,0 +1,50 @@
+/* $Id: estate.h,v 1.1 2001/03/28 10:56:34 davem Exp $ */
+#ifndef _SPARC64_ESTATE_H
+#define _SPARC64_ESTATE_H
+
+/* UltraSPARC-III E-cache Error Enable */
+#define ESTATE_ERROR_FMT	0x0000000000040000 /* Force MTAG ECC		*/
+#define ESTATE_ERROR_FMESS	0x000000000003c000 /* Forced MTAG ECC val	*/
+#define ESTATE_ERROR_FMD	0x0000000000002000 /* Force DATA ECC		*/
+#define ESTATE_ERROR_FDECC	0x0000000000001ff0 /* Forced DATA ECC val	*/
+#define ESTATE_ERROR_UCEEN	0x0000000000000008 /* See below			*/
+#define ESTATE_ERROR_NCEEN	0x0000000000000002 /* See below			*/
+#define ESTATE_ERROR_CEEN	0x0000000000000001 /* See below			*/
+
+/* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache
+ * errors 2) uncorrectable E-cache errors.  Such events only occur on reads
+ * of the E-cache by the local processor for: 1) data loads 2) instruction
+ * fetches 3) atomic operations.  Such events _cannot_ occur for: 1) merge
+ * 2) writeback 2) copyout.  The AFSR bits assosciated with these traps are
+ * UCC and UCU.
+ */
+
+/* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps
+ * for uncorrectable ECC errors and system errors.
+ *
+ * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT,
+ * or system bus BusERR:
+ * 1) As the result of an instruction fetch, will generate instruction_access_error
+ * 2) As the result of a load etc. will generate data_access_error.
+ * 3) As the result of store merge completion, writeback, or copyout will
+ *    generate a disrupting ECC_error trap.
+ * 4) As the result of such errors on instruction vector fetch can generate any
+ *    of the 3 trap types.
+ *
+ * The AFSR bits assosciated with these traps are EMU, EDU, WDU, CPU, IVU, UE,
+ * BERR, and TO.
+ */
+
+/* CEEN enables the ECC_error trap for hardware corrected ECC errors.  System bus
+ * reads resulting in a hardware corrected data or MTAG ECC error will generate an
+ * ECC_error disrupting trap with this bit enabled.
+ *
+ * This same trap will also be generated when a hardware corrected ECC error results
+ * during store merge, writeback, and copyout operations.
+ */
+
+/* In general, if the trap enable bits above are disabled the AFSR bits will still
+ * log the events even though the trap will not be generated by the processor.
+ */
+
+#endif /* _SPARC64_ESTATE_H */